Reliability and Materials Issues of III V and II VI Semiconductor Optical and Electron Devices and Materials II书籍详细信息
- ISBN:9781605114095
- 作者:Ueda, O.; Fukuda, M.; Shiojima, K.
- 出版社:暂无出版社
- 出版时间:暂无出版时间
- 页数:212
- 价格:暂无价格
- 纸张:暂无纸张
- 装帧:暂无装帧
- 开本:暂无开本
- 语言:暂无语言
- 适合人群:Researchers in materials science, semiconductor engineering, optical and electron device engineering, material scientists, semiconductor physicists, reliability engineers, graduate students in related fields, professionals in the semiconductor industry
- TAG:Materials Science / Semiconductor Devices / Reliability Engineering / Physics of Semiconductors / Semiconductor Materials / Electron Devices / Optical devices / III-V semiconductors / II-VI semiconductors
- 豆瓣评分:暂无豆瓣评分
- 更新时间:2025-05-17 00:26:02
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