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Design, Analysis and Test of Logic Circuits Under Uncertainty -
作者：Krishnaswamy, Smita; Markov, Igor L.; Hayes, John
Krishnaswamy, Smita; Markov, Igor L.; Hayes, John
人物简介：
Design, Analysis and Test of Logic Circuits Under Uncertainty书籍相关信息
- ISBN：9789048196432
- 作者：Krishnaswamy, Smita; Markov, Igor L.; Hayes, John
- 出版社：暂无出版社
- 出版时间：2012-10
- 页数：134
- 价格：$ 145.77
- 纸张：暂无纸张
- 装帧：暂无装帧
- 开本：暂无开本
- 语言：暂无语言
- 适合人群：Electronics engineers, Computer scientists, Electrical engineers, System designers, Researchers in reliability and uncertainty analysis
- TAG：Circuit Design / Uncertainty Analysis / Reliability Engineering / System Simulation / Logic circuits
- 豆瓣评分：暂无豆瓣评分
- 更新时间：2025-05-16 23:38:22
内容简介：
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design - one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
