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Fundamentals of Digital Semiconductor Testing(Version 4.0)
- 出版社:Soft Test Inc
Soft Test Inc
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Fundamentals of Digital Semiconductor Testing(Version 4.0)书籍相关信息
ISBN:9780965879705
作者:
Guy A. Perry
出版社:
Soft Test Inc
出版时间:2003-03-01
页数:暂无页数
价格:USD 100.00
纸张:暂无纸张
装帧:Spiral-bound
开本:暂无开本
语言:暂无语言
适合人群:Engineering Students, Electronics Engineers, Semiconductor Industry Professionals, Quality Assurance Engineers, Computer Science Researchers, Graduate Students in Engineering
TAG:
Computer Engineering
/
Digital Electronics
/
VLSI
/
Circuit analysis
/
quality control
/
Microelectronics
/
Semiconductor Testing
/
Chip Testing
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更新时间:2025-05-17 00:09:46
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ISBN:9780965879705
出版日期:2003-03-01
适合人群:Engineering Students, Electronics Engineers, Semiconductor Industry Professionals, Quality Assurance Engineers, Computer Science Researchers, Graduate Students in Engineering