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Afshar, Amir
人物简介：
Principles of Semiconductor Network Testing书籍相关信息
- ISBN：9780750694728
- 作者：Afshar, Amir
- 出版社：暂无出版社
- 出版时间：1995-6
- 页数：228
- 价格：$ 152.55
- 纸张：暂无纸张
- 装帧：暂无装帧
- 开本：暂无开本
- 语言：暂无语言
- 适合人群：Engineers in the semiconductor industry, electronics technicians, students studying electrical engineering, quality assurance professionals, and anyone interested in the field of semiconductor testing and network analysis
- TAG：Engineering / Electronics / Quality Assurance / Reliability / Semiconductor / Network Testing / Solid-State Devices / Test Equipment
- 豆瓣评分：暂无豆瓣评分
- 更新时间：2025-05-17 00:10:23
内容简介：
This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. It introduces a novel component-testing philosophy for semiconductor test, product and design engineers. It provides best new source of information for experienced semiconductor engineers as well as entry-level personnel. It includes eight chapters about semiconductor testing.
