暂无相关内容,正在全力查找中
Mastro, M.; Laroche, J.; Ren, F.
人物简介:
Performance and Reliability of Semiconductor Devices书籍相关信息
- ISBN:9781605110806
- 作者:Mastro, M.; Laroche, J.; Ren, F.
- 出版社:暂无出版社
- 出版时间:2009-4
- 页数:259
- 价格:$ 129.95
- 纸张:暂无纸张
- 装帧:暂无装帧
- 开本:暂无开本
- 语言:暂无语言
- 适合人群:Electronics Engineers, Materials Scientists, Reliability Engineers, Semiconductor Researchers, Undergraduate and Graduate Students in Electronics and Materials Science, Professionals in the Semiconductor Industry
- TAG:material science / Electrical Engineering / Semiconductor Devices / Microelectronics / Electronics Engineering / Reliability Engineering / Physics of Semiconductors
- 豆瓣评分:暂无豆瓣评分
- 更新时间:2025-05-17 00:25:16
内容简介:
Despite the rapid development in semiconductor-based devices, there exist fundamental materials and physics issues that limit the reliability and performance of optoelectronic and electronic devices. This book examines the latest technical advancements and emerging trends in semiconductor materials and devices. The Gallium Nitride Electronic Devices chapter offers an overview of the state-of-the-art in high electron mobility transistor (HEMT) devices with interesting work on circumventing the current performance limiters in this device structure. Nano-Engineered Devices provides a snapshot of the current understanding in modifying the nanoscale specific properties of quantum dot and quantum well devices. The Performance of Semiconductor Devices chapter surveys advancements in several fields including terahertz ellipsometry, high-power multi-emitter laser bars, and thin-film transistors. Advanced Materials and Devices, highlights designs in ultrathin high-kappa gate dielectrics for CMOS and related devices and also reports on the implementation of III-V materials as a replacement for the silicon channel in future CMOS technology.