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An Electron Microscope and Field Ion Microscope Study of Defects in Quenched Platinum -
作者：Newman, Robert William
Newman, Robert William
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An Electron Microscope and Field Ion Microscope Study of Defects in Quenched Platinum书籍相关信息
- ISBN：9781178497007
- 作者：Newman, Robert William
- 出版社：暂无出版社
- 出版时间：暂无出版时间
- 页数：182
- 价格：暂无价格
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- 适合人群：academic researchers in materials science, metallurgy, solid state physics, physicists, engineers specializing in materials engineering, undergraduate and graduate students in related fields
- TAG：Materials Science / Solid State Physics / Electron microscopy / field ion microscopy / quenched materials / platinum defects / physical metallurgy
- 豆瓣评分：暂无豆瓣评分
- 更新时间：2025-05-17 03:02:37
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