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Optical Characterization of Epitaxial Semiconductor Layers -
作者：Bauer, G. Nther; Richter, Wolfgang; Bauer, Gunther
Bauer, G. Nther; Richter, Wolfgang; Bauer, Gunther
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Optical Characterization of Epitaxial Semiconductor Layers书籍相关信息
- ISBN：9783642796807
- 作者：Bauer, G. Nther; Richter, Wolfgang; Bauer, Gunther
- 出版社：Springer
- 出版时间：2012-7-31
- 页数：445
- 价格：USD 99.00
- 纸张：暂无纸张
- 装帧：Paperback
- 开本：暂无开本
- 语言：暂无语言
- 适合人群：Researchers in semiconductor physics, materials science, optical engineering, solid-state physics, and microelectronics; graduate students in these fields; professionals involved in semiconductor fabrication and characterization
- TAG：Materials Science / Solid State Physics / Microelectronics / Semiconductor Physics / Thin Films / Optical Properties / epitaxy
- 豆瓣评分：暂无豆瓣评分
- 更新时间：2025-05-20 20:06:20
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