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Characterization of Metal-Oxide-Semiconductor Structures at Low Temperatures Using Self-Aligned and Vertically Coupled Aluminum and Silicon Single-Ele -
作者：Sun, Luyan
Sun, Luyan
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Characterization of Metal-Oxide-Semiconductor Structures at Low Temperatures Using Self-Aligned and Vertically Coupled Aluminum and Silicon Single-Ele书籍相关信息
- ISBN：9781243582386
- 作者：Sun, Luyan
- 出版社：暂无出版社
- 出版时间：暂无出版时间
- 页数：232
- 价格：暂无价格
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- 适合人群：researchers in semiconductor physics, material scientists, engineers in the field of microelectronics, graduate students in electrical engineering and materials science
- TAG：Microelectronics / Semiconductor Physics / Vertical Structure / low temperature characterization / metal-oxide-semiconductor structures / self-aligned technology / aluminum and silicon
- 豆瓣评分：暂无豆瓣评分
- 更新时间：2025-05-20 21:07:12
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