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Ueda, Osamu
人物简介：
Reliability and Degradation of III-V Optical Devices书籍相关信息
- ISBN：9780890066522
- 作者：Ueda, Osamu
- 出版社：暂无出版社
- 出版时间：1996-1
- 页数：372
- 价格：$ 168.37
- 纸张：暂无纸张
- 装帧：暂无装帧
- 开本：暂无开本
- 语言：暂无语言
- 适合人群：Engineers in semiconductor and optoelectronics fields, Material scientists, Researchers in reliability and degradation of electronic devices, Graduate students and professionals in physics and engineering, Quality assurance and manufacturing engineers
- TAG：material science / Semiconductor Devices / Optoelectronics / Reliability Engineering / Physics of Semiconductors / III-V compound semiconductors / Degradation mechanisms / Optical devices / Device failure analysis
- 豆瓣评分：暂无豆瓣评分
- 更新时间：2025-05-17 00:25:20
内容简介：
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.
